IEC 62132-1-2006 集成电路.150kHz～1GHz电磁抗扰度的测量.第1部分:一般条件和定义
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【英文标准名称】:Integratedcircuits-Measurementofelectromagneticimmunity,150kHzto1GHz-Part1:Generalconditionsanddefinitions
【原文标准名称】:集成电路.150kHz～1GHz电磁抗扰度的测量.第1部分:一般条件和定义
【标准号】:IEC62132-1-2006
【标准状态】:现行
【国别】:国际
【发布日期】:2006-01
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/SC47A
【标准类型】:()
【标准水平】:()
【中文主题词】:电路;定义;电气工程;电磁的;电磁兼容性;频率范围;一般条件;总论;影响量;集成电路;干扰抑制;磁电效应;测量;测量条件;测量结果;测量技术
【英文主题词】:Circuits;Definitions;Electricalengineering;Electromagnetic;Electromagneticcompatibility;Frequencyranges;Generalconditions;Generalsection;Influencequantities;Integratedcircuits;Interferencerejections;Magnetoelectriceffects;Measurement;Measurementconditions;Measuringresults;Measuringtechniques
【摘要】:ThispartofIEC62132providesgeneralinformationanddefinitionsonmeasurementofconductedandradiatedelectromagneticimmunityofintegratedcircuits(ICs)toconductedandradiateddisturbances.Italsoprovidesadescriptionofmeasurementconditions,testequipmentandset-up,aswellasthetestproceduresandcontentofthetestreports.AtestmethodcomparisontableisincludedinAnnexAtoassistinselectingtheappropriatemeasurementmethod(s).ThisstandarddescribesgeneralconditionsrequiredtoobtainaquantitativemeasureofimmunityofICsinauniformtestingenvironment.Criticalparametersthatareexpectedtoinfluencethetestresultsaredescribed.Deviationsfromthisstandardarenotedexplicitlyintheindividualtestreport.Themeasurementresultscanbeusedforcomparisonorotherpurposes.Measurementoftheinjectedvoltagesandcurrents,togetherwiththeresponsesoftheICstestedatcontrolledconditions,yieldsinformationaboutthepotentialimmunityoftheICtoconductedandradiatedRFdisturbancesinagivenapplication.
【中国标准分类号】:L56
【国际标准分类号】:31_200
【页数】:54P.;A4
【正文语种】:英语
【原文标准名称】:集成电路.150kHz～1GHz电磁抗扰度的测量.第1部分:一般条件和定义
【标准号】:IEC62132-1-2006
【标准状态】:现行
【国别】:国际
【发布日期】:2006-01
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/SC47A
【标准类型】:()
【标准水平】:()
【中文主题词】:电路;定义;电气工程;电磁的;电磁兼容性;频率范围;一般条件;总论;影响量;集成电路;干扰抑制;磁电效应;测量;测量条件;测量结果;测量技术
【英文主题词】:Circuits;Definitions;Electricalengineering;Electromagnetic;Electromagneticcompatibility;Frequencyranges;Generalconditions;Generalsection;Influencequantities;Integratedcircuits;Interferencerejections;Magnetoelectriceffects;Measurement;Measurementconditions;Measuringresults;Measuringtechniques
【摘要】:ThispartofIEC62132providesgeneralinformationanddefinitionsonmeasurementofconductedandradiatedelectromagneticimmunityofintegratedcircuits(ICs)toconductedandradiateddisturbances.Italsoprovidesadescriptionofmeasurementconditions,testequipmentandset-up,aswellasthetestproceduresandcontentofthetestreports.AtestmethodcomparisontableisincludedinAnnexAtoassistinselectingtheappropriatemeasurementmethod(s).ThisstandarddescribesgeneralconditionsrequiredtoobtainaquantitativemeasureofimmunityofICsinauniformtestingenvironment.Criticalparametersthatareexpectedtoinfluencethetestresultsaredescribed.Deviationsfromthisstandardarenotedexplicitlyintheindividualtestreport.Themeasurementresultscanbeusedforcomparisonorotherpurposes.Measurementoftheinjectedvoltagesandcurrents,togetherwiththeresponsesoftheICstestedatcontrolledconditions,yieldsinformationaboutthepotentialimmunityoftheICtoconductedandradiatedRFdisturbancesinagivenapplication.
【中国标准分类号】:L56
【国际标准分类号】:31_200
【页数】:54P.;A4
【正文语种】:英语
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